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Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact - Springer Series in Materials Science Cor Claeys 1st ed. 2018 edition
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Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact - Springer Series in Materials Science
Cor Claeys
material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.
438 pages, 207 Illustrations, color; 8 Illustrations, black and white; XXXIII, 438 p. 215 illus., 20
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 22 de agosto de 2018 |
| ISBN13 | 9783319939247 |
| Editoras | Springer International Publishing AG |
| Páginas | 438 |
| Dimensões | 163 × 245 × 31 mm · 818 g |
| Idioma | Francês |
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