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Reliability and Failure of Electronic Materials and Devices Ohring, Milton (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))
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Reliability and Failure of Electronic Materials and Devices
Ohring, Milton (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))
Suitable as a reference work for reliability professionals or as a text for graduate students, this book introduces reliability literature of microelectronic and electronic-optional devices. It integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation.
692 pages, b&w illustrations
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 29 de maio de 1998 |
| ISBN13 | 9780125249850 |
| Editoras | Elsevier Science Publishing Co Inc |
| Páginas | 720 |
| Dimensões | 151 × 229 × 37 mm · 1,10 kg |
