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Fundamentals of Electromigration-Aware Integrated Circuit Design Jens Lienig Second Edition 2025 edition
Fundamentals of Electromigration-Aware Integrated Circuit Design
Jens Lienig
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 26 de fevereiro de 2025 |
| ISBN13 | 9783031800221 |
| Editoras | Springer International Publishing AG |
| Páginas | 167 |
| Dimensões | 150 × 220 × 20 mm · 479 g |
| Idioma | Alemão |