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X-ray Scattering from Semiconductors (2nd Edition) Fewster, Paul F (PANalytical Research Centre, UK) 2 Revised edition
X-ray Scattering from Semiconductors (2nd Edition)
Fewster, Paul F (PANalytical Research Centre, UK)
A practical guide to the analysis of materials, including a description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general.
316 pages, Illustrations
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 8 de julho de 2003 |
| ISBN13 | 9781860943607 |
| Editoras | Imperial College Press |
| Páginas | 316 |
| Dimensões | 154 × 230 × 24 mm · 666 g |
| Idioma | Inglês |