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Applied Life Data Analysis - Wiley Series in Probability and Statistics Nelson, Wayne B. (California Institute of Technology (Caltech); University of Illinois)
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Applied Life Data Analysis - Wiley Series in Probability and Statistics
Nelson, Wayne B. (California Institute of Technology (Caltech); University of Illinois)
WILEY--INTERSCIENCE PAPERBACK SERIES The Wiley--Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation.
662 pages, illustrations
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 8 de dezembro de 2003 |
| Data do lançamento original | 2004 |
| ISBN13 | 9780471644620 |
| Editoras | John Wiley & Sons Inc |
| Páginas | 664 |
| Dimensões | 159 × 238 × 37 mm · 848 g |
| Idioma | Inglês |
![Cover for Nelson, Wayne B. (California Institute of Technology (Caltech); University of Illinois) · Accelerated Testing: Statistical Models, Test Plans, and Data Analysis - Wiley Series in Probability and Statistics (Paperback Book) [2 Revised edition] (2007)](https://imusic.b-cdn.net/images/item/original/367/9780471697367.jpg?nelson-wayne-b-california-institute-of-technology-caltech-university-of-illinois-2007-accelerated-testing-statistical-models-test-plans-and-data-analysis-wiley-series-in-probability-and-statistics-paperback-book&class=scaled&v=1412958069)
