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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Peter W Hawkes 157 edition
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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers
Peter W Hawkes
Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains.
373 pages, Illustrations
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 1 de agosto de 2009 |
| ISBN13 | 9780123747686 |
| Editoras | Elsevier Science Publishing Co Inc |
| Gênero | Aspects (Academic) > Science / Technology Aspects |
| Páginas | 373 |
| Dimensões | 151 × 229 × 32 mm · 757 g |
| Idioma | Inglês |
| Editor de séries | Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) |
