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Advanced Mathematical and Computational Tools in Metrology and Testing Xi - Series on Advances in Mathematics for Applied Sciences Alistair B Forbes-Sascha Eichstadt-Nien Fan Zhang-
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Advanced Mathematical and Computational Tools in Metrology and Testing Xi - Series on Advances in Mathematics for Applied Sciences
Alistair B Forbes-Sascha Eichstadt-Nien Fan Zhang-
460 pages
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 14 de dezembro de 2018 |
| ISBN13 | 9789813274297 |
| Editoras | World Scientific Publishing Co Pte Ltd |
| Páginas | 458 |
| Dimensões | 237 × 194 × 25 mm · 788 g |
| Editor | Chunovkina, Anna (Institute for Metrology “D I Mendeleyev”, Russia) |
| Editor | Eichstadt, Sascha (Physikalisch-Technische Bundesanstalt, Germany) |
| Editor | Forbes, Alistair B (National Physical Laboratory, UK) |
| Editor | Pavese, Franco (IMEKO TC21, Italy) |
| Editor | Zhang, Nien-Fan (National Institute of Standards and Technology, USA) |
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