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Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices - Selected Topics in Electronics and Systems Daniel M. Fleetwood
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Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices - Selected Topics in Electronics and Systems
Daniel M. Fleetwood
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (Mos), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
348 pages, Illustrations
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 3 de agosto de 2004 |
| ISBN13 | 9789812389404 |
| Editoras | World Scientific Publishing Co Pte Ltd |
| Páginas | 348 |
| Dimensões | 168 × 249 × 23 mm · 680 g |
| Idioma | Inglês |
| Editor | Fleetwood, D M (Vanderbilt University, USA) |
| Editor | Schrimpf, R D (Vanderbilt University, USA) |
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