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Progress in Nanoscale Characterization and Manipulation - Springer Tracts in Modern Physics Softcover Reprint of the Original 1st 2018 edition
Progress in Nanoscale Characterization and Manipulation - Springer Tracts in Modern Physics
It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy.
508 pages, 26 Illustrations, color; 307 Illustrations, black and white; VII, 508 p. 333 illus., 26 i
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 11 de janeiro de 2019 |
| ISBN13 | 9789811344206 |
| Editoras | Springer Verlag, Singapore |
| Páginas | 508 |
| Dimensões | 330 × 235 × 30 mm · 750 g |
| Editor | Bai, Xuedong |
| Editor | Tao, Jing |
| Editor | Wang, Chen |
| Editor | Wang, Rongming |
| Editor | Zhang, Hongzhou |