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Optical Characterization of Epitaxial Semiconductor Layers G Nther Bauer Softcover reprint of the original 1st ed. 1996 edition
Optical Characterization of Epitaxial Semiconductor Layers
G Nther Bauer
The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decade.
429 pages, biography
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 14 de dezembro de 2011 |
| ISBN13 | 9783642796807 |
| Editoras | Springer-Verlag Berlin and Heidelberg Gm |
| Páginas | 429 |
| Dimensões | 155 × 235 × 23 mm · 625 g |
| Idioma | Alemão |
| Editor | Bauer, Gunther |
| Editor | Richter, Wolfgang |