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Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach - NanoScience and Technology Marin Alexe 2004 edition
Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach - NanoScience and Technology
Marin Alexe
This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM).
282 pages, biography
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 6 de abril de 2004 |
| ISBN13 | 9783540206620 |
| Editoras | Springer-Verlag Berlin and Heidelberg Gm |
| Páginas | 282 |
| Dimensões | 155 × 235 × 18 mm · 544 g |
| Idioma | Alemão |
| Editor | Alexe, Marin |
| Editor | Gruverman, Alexei |