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Defect and Impurity Engineered Semiconductors and Devices: Volume 378 - MRS Proceedings
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Defect and Impurity Engineered Semiconductors and Devices: Volume 378 - MRS Proceedings
Defect engineering has come of age. That theme is well documented by both the academic and industrial research communities in this book from MRS. Going beyond defect control, the book explores the engineering of desired properties in semiconductor materials and devices through the deliberate introduction and manipulation of defects and impurities.
1054 pages
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 16 de outubro de 1995 |
| ISBN13 | 9781558992818 |
| Editoras | Materials Research Society |
| Páginas | 1082 |
| Dimensões | 160 × 237 × 62 mm · 1,70 kg |
| Idioma | Inglês |
| Editor | Akasaki, I. (Meijo University, Japan) |
| Editor | Ashok, S. (Pennsylvania State University) |
| Editor | Chevallier, J. |
| Editor | Johnson, N. M. (Xerox Palo Alto Research Center, Stanford University, California) |
| Editor | Sopori, B. L. (National Renewable Energy Laboratory, Golden, Colorado) |
