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Random Testing of Digital Circuits: Theory and Applications Rene David 1º edição
Random Testing of Digital Circuits: Theory and Applications
Rene David
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
496 pages, bibliography, illustrations
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 8 de abril de 1998 |
| ISBN13 | 9780824701826 |
| Editoras | Taylor & Francis Inc |
| Páginas | 500 |
| Dimensões | 152 × 229 × 29 mm · 853 g |
| Idioma | Inglês |