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Logic Testing and Design for Testability - Computer Systems Series Hideo Fujiwara
Logic Testing and Design for Testability - Computer Systems Series
Hideo Fujiwara
Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing.
304 pages, black & white tables, figures
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 31 de julho de 1985 |
| ISBN13 | 9780262561990 |
| Editoras | MIT Press Ltd |
| Páginas | 304 |
| Dimensões | 152 × 229 × 25 mm · 408 g |
| Idioma | Inglês |