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Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces - Oxford Series in Optical and Imaging Sciences Sarid, Dror (Professor, Optical Sciences Center, Professor, Optical Sciences Center, University of Arizona, USA) Revised edition
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Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces - Oxford Series in Optical and Imaging Sciences
Sarid, Dror (Professor, Optical Sciences Center, Professor, Optical Sciences Center, University of Arizona, USA)
This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed.
282 pages, halftones, line drawings, tables
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 20 de outubro de 1994 |
| ISBN13 | 9780195092042 |
| Editoras | Oxford University Press Inc |
| Páginas | 288 |
| Dimensões | 162 × 241 × 23 mm · 679 g |
| Idioma | Inglês |