Monte Carlo Modeling for Electron Microscopy and Microanalysis - Oxford Series in Optical and Imaging Sciences - Joy, David C. (Director, Electron Microscope Facility, Director, Electron Microscope Facility, University of Tennessee) - Livros - Oxford University Press Inc - 9780195088748 - 15 de junho de 1995

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Joy, David C. (Director, Electron Microscope Facility, Director, Electron Microscope Facility, University of Tennessee)
Monte Carlo Modeling for Electron Microscopy and Microanalysis - Oxford Series in Optical and Imaging Sciences Joy, David C. (Director, Electron Microscope Facility, Director, Electron Microscope Facility, University of Tennessee)

Name: Monte Carlo Modeling for Electron Microscopy and Microanalysis - Oxford Series in Optical and Imaging Sciences
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Author: Joy, David C. (Director, Electron Microscope Facility, Director, Electron Microscope Facility, University of Tennessee)

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Monte Carlo Modeling for Electron Microscopy and Microanalysis - Oxford Series in Optical and Imaging Sciences

Joy, David C. (Director, Electron Microscope Facility, Director, Electron Microscope Facility, University of Tennessee)

This book is a practical guide to the use of Monte Carlo simulation techniques for the study of electron solid interactions in the electron microscope. Programs, optimized for use on personal computers, are developed to deal with typical applications including secondary, and back- scattered, electron imaging. EBIC imaging of semiconductors and X-ray microanalysis.

224 pages, line figures, tables

Mídia	Livros Hardcover Book (Livro com lombada e capa dura)
Lançado	15 de junho de 1995
ISBN13	9780195088748
Editoras	Oxford University Press Inc
Páginas	224
Dimensões	234 × 156 × 14 mm · 499 g
Idioma	Inglês

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